- HOME
- 기술정보
- 특허
특허
특허/실용신안
NANOPARTICLE ASSISTED SCANNING FOCUSING X-RAY FLUORESCENCE IMAGING AND ENHANCED TREATMENT
특허 실용신안 개요
| 기관명 | NDSL |
|---|---|
| 출원인 | THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
| 출원번호 | US-0053664 |
| 출원일자 | 2016-02-25 |
| 공개번호 | 20160901 |
| 공개일자 | 0000-00-00 |
| 등록번호 | |
| 등록일자 | 0000-00-00 |
| 권리구분 | USAP |
| 초록 | The present disclosure provides systems and methods for providing irradiation energy, imaging, and detecting X-ray fluorescence from a volume in a sample. The present disclosure further relates to methods of increasing the delivery of irradiation energy to a target in a sample. |
| 원문URL | http://click.ndsl.kr/servlet/OpenAPIDetailView?keyValue=03553784&target=USAP&cn=USA2016090252471 |
| 첨부파일 |
추가정보
| 과학기술표준분류 | |
|---|---|
| ICT 기술분류 | |
| IPC분류체계CODE | |
| 주제어 (키워드) |