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논문 기본정보

Multispectral Wavelength Selection to Detect 'Fuji' Apple Surface Defects with Pixel-sampling Analysis

논문 개요

기관명, 저널명, ISSN, ISBN 으로 구성된 논문 개요 표입니다.
기관명 NDSL
저널명 바이오시스템공학 = Journal of biosystems engineering
ISSN 1738-1266,
ISBN

논문저자 및 소속기관 정보

저자, 소속기관, 출판인, 간행물 번호, 발행연도, 초록, 원문UR, 첨부파일 순으로 구성된 논문저자 및 소속기관 정보표입니다
저자(한글) Park, Soo Hyun,Lee, Hoyoung,Noh, Sang Ha
저자(영문)
소속기관
소속기관(영문)
출판인
간행물 번호
발행연도 2014-01-01
초록 Purpose: In this study, we focused on the image processing method to determine the external quality of Fuji apples by identifying surface defects such as scabs and bruises. Method: A CCD camera was used to capture filter images with 24 different wavelengths ranging between 530 nm and 1050 nm. Image subtraction and division operations were performed to distinguish the defect area from the normal areas including calyx, stem, and glaring on the apple surface image. All threshold values of the image were examined to reveal the defect area of pretreated filter images. Results: The developed operation methods were [image (720 nm) - image (900 nm)]/image (700 nm) for bruise detection and [image (740 nm) - image (900 nm)]/image (590 nm) for scab detection, which revealed 81% and 90% recognition ratios, respectively. Conclusions: Our results showed several optimal wavelengths and image processing methods to detect Fuji apple surface defects such as bruises and scabs.
원문URL http://click.ndsl.kr/servlet/OpenAPIDetailView?keyValue=03553784&target=NART&cn=JAKO201427542600412
첨부파일

추가정보

과학기술표준분류, ICT 기술분류,DDC 분류,주제어 (키워드) 순으로 구성된 추가정보표입니다
과학기술표준분류
ICT 기술분류
DDC 분류
주제어 (키워드) Apple bruise,Apple scab,Image process,Pixel sampling analysis,Surface defect