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논문 기본정보
Degradation characteristics of 2G HTS tapes with respect to an electrical breakdown
논문 개요
| 기관명 | NDSL |
|---|---|
| 저널명 | Progress in superconductivity and cryogenics : PSAC |
| ISSN | 1229-3008,2287-6251 |
| ISBN |
논문저자 및 소속기관 정보
| 저자(한글) | Kang, Jong O,Lee, Onyou,Mo, Young Kyu,Kim, Junil,Bang, Seungmin,Lee, Hongseok,Lee, Jae-Hun,Jang, Cheolyeong,Kang, Hyoungku |
|---|---|
| 저자(영문) | |
| 소속기관 | |
| 소속기관(영문) | |
| 출판인 | |
| 간행물 번호 | |
| 발행연도 | 2015-01-01 |
| 초록 | The electrical insulation design for a superconducting coil system is important for developing high voltage superconducting apparatuses. Also, the degraded characteristics of superconducting tapes due to an electrical breakdown should be considered for superconducting coils design. In this study, the degradation characteristics of 2G high temperature superconducting (HTS) tapes were studied with respect to electrical breakdown tests. The degradation tests of 2G HTS tapes were performed with various stabilizer materials. The degradation characteristics of 2G HTS tapes such as critical current(Ic) and index number were observed by performing electrical breakdown tests. It was found that the characteristics such as Ic and index number can be degraded by an electrical breakdown. Moreover, it was concluded that the degradation characteristics of 2G HTS tapes were affected by a stabilizer material and applied breakdown voltage. The cross sectional view of 2G HTS tapes was observed by using a scanning electron microscope (SEM). As results, it is found that the degradation characteristics of 2G HTS tapes are concerned with hardness and electrical resistivity of stabilizer layers. |
| 원문URL | http://click.ndsl.kr/servlet/OpenAPIDetailView?keyValue=03553784&target=NART&cn=JAKO201510763641999 |
| 첨부파일 |
추가정보
| 과학기술표준분류 | |
|---|---|
| ICT 기술분류 | |
| DDC 분류 | |
| 주제어 (키워드) | degradation characteristics,critical current,electrical breakdown,index number,stabilizer,2G HTS tapes |