Preparation and Electrical Properties of Ferroelectric lt;TEX gt;$Bi_{3.3}Eu_{0.7}Ti_3O_{12}$ lt;/TEX gt; Thin Films for Memory Applications
기관명 | NDSL |
---|---|
저널명 | 한국전기전자재료학회 2005년도 추계학술대회 논문집 Vol.18 |
ISSN | , |
ISBN |
저자(한글) | Kang, Dong-Kyun,Park, Won-Tae,Kim, Byong-Ho |
---|---|
저자(영문) | |
소속기관 | |
소속기관(영문) | |
출판인 | |
간행물 번호 | |
발행연도 | 2005-01-01 |
초록 | Ferroelectric Eu-substituted $Bi_4Ti_3O_{12}$ (BET) thin films with a thickness of 200 nm were deposited on Pt(111)/Ti/SiO $_2$ /Si(100) substrate by means of the liquid delivery MOCVD system and annealed at several temperatures in an oxygen atmosphere. At annealing temperature above $600^{ circ}C$ , the microstructure of layered perovskite phase was observed. The remanent polarization of these films increased with increase in annealing temperature. The remanent polarization values ( $2P_r$ ) of the BET thin films annealed at $720^{ circ}C$ were $37.71{ mu}C/cm^2$ at an applied voltage of 5 V. |
원문URL | http://click.ndsl.kr/servlet/OpenAPIDetailView?keyValue=03553784&target=NPAP&cn=NPAP08120302 |
첨부파일 |
과학기술표준분류 | |
---|---|
ICT 기술분류 | |
DDC 분류 | |
주제어 (키워드) | Eu-substituted lt,TEX gt,$Bi_4Ti_3O_{12}$ lt,/TEX gt,. liquid delivery MOCVD,microstructure |