고출력 LD 특성 평가 시스템
기관명 | ZEUS |
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장비번호 | |
제작사 | 포톤데이즈 |
모델명 | 모델명 없음 |
장비사양 | |
취득일자 | 2012-03-14 |
취득금액 |
보유기관명 | 한국광기술원 |
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보유기관코드 | |
활용범위 | |
활용상태 | |
표준코드 | C515 |
표준분류명 | |
시설장비 설명 | 1) The main purpose of this system is to measure the total characteristics of the high power laser diode package such as CS-mount C-mount and micro-channel package 2) The fixtures or jigs of various LD packages are changeable easily and tested under the various temperature conditions 3) The measurement items are the L-I-V sweep spectrum(wavelength) near field pattern and far field pattern according to current of LDs. all items are tested automatically by computer-controlled automatic operation 4) Thermopile sensor is used for measurement of the optical high power of LDs and its temperature is controlled by water or air 5) The integrating sphere and optical spectrum analyzer (OSA) in the system measure relative spectral radiance of LDs 6) The goniometer measures the far field pattern of LDs in any direction of hemisphere due to two - dimensional scanning mechanism 7) The temperature LDs is controlled by TEC and water cooled by chiller 8) This system includes the burn in and long term aging function of LDs for reliability characteristic1. Main System 1) Power Supply Specification a) Output current - Range[A] : 0 - 150 - Resolution[A] : 0.1 - Accuracy[%] : ± 0.25 - Noise/Ripple(mA rms) : 1kW - Cooling : Chiller Method - Temperature : 15 ~ 30℃ - Water : Designed for de-ionized water - High Temperature Stability : ± 0.1℃ - Flow rate measuring and monitoring - Water filter - Remote Start - Conductivity Control : 1 to 30 ㎲ - Using the DI Cartridge : Replaceable cartridge in water by-pass - Ambient Temperature Sensor - Cooling Power Measurement : Additional temperature sensor on return flow - Pressure measurement : pressure sensor on chiller outlet - Water by-pass : Adjustment of flow mounted on the front panel or internally - Second flow sensor : second flow sensor on the return flow - Air Filter : Air screens in the side panel 3) Spectrum Measurement Specification - Mode : Double-pass monochromator mode - Applicable fiber : SM or MM (50/62.5 ㎛) - Measurement wavelength range : 350 to 1750 nm - Wavelength accuracy a) ±0.05nm (25±5℃ 10/125 SM Fiber) b) ±0.05nm (1510 to 1570nm 10/125 SM Fiber) - Wavelength resolution : 0.05 to 10nm - Measurement level range a) -85 to +20dBm (1200 to 1600nm) b) -80 to +20dBm (600 to 1200nm) c) -65 to +20dBm (350 to 1750nm) - Dynamic range a) 70dB (±1nm 633/1152/1523nm) b) 60dB (±0.5nm 633/1152/1523nm) - Communication Interface : GPIB 4) Power Measurement Specification * 2-Detectors selectable (low power & high power) a) Low Power Detector - Type : Thermopile sensor - Power range : 5 mW ~ 10 W - Spectral range : 0.19 ~ 11 ㎛ - Energy range : 5 J ~ 200 J - Rise Time : 2 sec - Sensitivity : 0.12 mV/W - Repeatability : ±0.5 % - Damage threshold : 45 kW/㎠ - Effective Aperature Diameter : Φ55 mm - Cooling : AIR-cooled - Data Transfer : USB b) High Power Detector - Type : Thermopile sensor - Power range : 1000 W - Spectral range : 0.19 ~ 20 ㎛ - Rise Time : 2.8 sec - Sensitivity : 0.06 mV/W - Repeatability : ±0.5 % - Damage threshold : 45 kW/㎠ - Effective Aperature Diameter : Φ55 mm - Cooling : Water-cooled - Data Transfer : USB 5) Near Field Pattern Measurement Specification - Digital Camera : 1392 x 1030 pixel - Lens : FOV 13.2 mm - Measurement Area : > 1mm - Neutral Density Filter : O.D. 1 2 - Beam Dump & Beam Splitter - Measurement items a) Measurement area : > 10mm b) Emitter position : x y c) Emitter size d) Emitter number - Manual stage for fine alignment - Vision Interface : USB 6) Far Field Pattern Measurement Specification - Detector : Si-Photo Diode - Photo Diode Active Area : Φ1mm - Pin hole size : 100㎛ - Scanner : Vertical & Horizontal both - Distance btw LD & Photo diode : 200mm - Actuator : Micro step motor and driver - Fine adjustment : X-Y-Z manual stages each axis - Measurement Items a) Vertical Divergence Angle b) Horizontal Divergence Angle 7) L- |
장비이미지코드 | http://nfec.ntis.go.kr/storage/images/equip/photo/201309/.thumb/20130925142116132.jpg |
장비위치주소 | 광주 북구 월출동 한국광기술원 971-35 한국광기술원 사업화동 2층 206 |
NFEC 등록번호 | NFEC-2013-02-175089 |
예약방법 | |
카타로그 URL | |
메뉴얼 URL | |
원문 URL | http://www.zeus.go.kr/equip/read?equipId=Z-NTIS-0037448 |
첨부파일 |
과학기술표준분류 | |
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ICT 기술분류 | |
주제어 (키워드) |