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장비 및 시설 기본정보

필름 건조 분석기

장비 개요

기관명, 장비번호, 제작사, 모델명, 장비사양, 취득일자, 취득금액 순으로 구성된 표입니다.
기관명 ZEUS
장비번호
제작사 Formulaction
모델명 Horus
장비사양
취득일자 2011-03-07
취득금액

보유기관 및 이용정보

보유기관명, 보유기관코드, 활용범위, 활용상태, 표준코드, 표준분류명, 시설장비 설명, 장비이미지코드, 장비위치주소, NFEC 등록번호, 예약방법, 카타로그 URL, 메뉴얼 URL, 원문 URL, 첨부파일 순으로 구성된 표입니다.
보유기관명 한국세라믹기술원
보유기관코드
활용범위
활용상태
표준코드
표준분류명
시설장비 설명 1. Automatic measurement of drying and curing properties of film-forming products by diffusing wave spectroscopy
2. Optical measurement of the scatterers motion inside the sample as a function of time.
3. Data acquisition time is continually optimized to achieve the best measurement of high and low speckle rates to ensure accuracy and reponsiveness with Adaptive Speckle Imaging Interferometry
4. Realistic test conditions with optical non intrusive open measurement
5. Sample thickness is applied up to 500 microns
6. Measurement on various substrates such as metal plastic glass wood concrete paper film...
7. Any systems are applicable water-based solvent-based solvent free two components...
8. Multiple-head configuration to allow simultaneous measurements for comparison with a reference sample in identical conditions and for higher productivity.
9. determination of characteristic druing times dust free touch dry dry hard...
10. Druing and cruing mechanisms and kinetics are monitored.
11. UV curing coating & transparent products can be analyzed
12. Data acquisition from seconds to several days for long-term analysis and up to 30 acquisitions/sec for high responsiveness.
13. Data stored in database and exportable to Excel or compatible software.Features
1. Automatic measurement of drying and curing properties of film-forming products by diffusing wave spectroscopy
2. Optical measurement of the scatterers motion inside the sample as a function of time.
3. Data acquisition time is continually optimized to achieve the best measurement of high and low speckle rates to ensure accuracy and reponsiveness with Adaptive Speckle Imaging Interferometry
4. Realistic test conditions with optical, non intrusive, open measurement
5. Sample thickness is applied up to 500 microns
6. Measurement on various substrates such as metal, plastic, glass, wood, concrete, paper, film...
7. Any systems are applicable water-based, solvent-based, solvent free, two components...
8. Multiple-head configuration to allow simultaneous measurements for comparison with a reference sample in identical conditions and for higher productivity.'Automatic measurement of drying and curing properties of film-forming products by diffusing wave spectroscopy
장비이미지코드 http://nfec.ntis.go.kr/storage/images/equip/photo/201203/.thumb/20120320160432.jpg
장비위치주소 경상남도 진주시 소호로 101 (충무공동) 한국세라믹기술원 본관동 1층 107
NFEC 등록번호 NFEC-2012-03-156394
예약방법
카타로그 URL
메뉴얼 URL
원문 URL http://www.zeus.go.kr/equip/read?equipId=Z-NTIS-0031463
첨부파일

추가정보

과학기술표준분류, ICT 기술분류, 주제어 순으로 구성된 표입니다.
과학기술표준분류
ICT 기술분류
주제어 (키워드)