반도체 특성 분석 장비
기관명 | ZEUS |
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장비번호 | |
제작사 | Keithley Instruments |
모델명 | 4200-SCS |
장비사양 | |
취득일자 | 2005-05-20 |
취득금액 |
보유기관명 | (주)엠아이텍 |
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보유기관코드 | |
활용범위 | |
활용상태 | |
표준코드 | C514 |
표준분류명 | |
시설장비 설명 | Intuitive point-and-click Windows-based environment Unique Remote PreAmps extend the resolution of SMUs to 0.1fA C-V instrument makes C-V measurements as easy as DC I-V Pulse and pulse I-V capabilities for advanced semiconductor testing Scope card provides integrated scope and pulse measure functionality Self-contained PC provides fast test setup powerful data analysis graphing and printing and on-board mass storage of test results Unique broweser-style Project Navigator organizes tests by device type allows access to multiple tests and provides test sequencing and looping control Built-in stress/measure looping and data analysis for point-and-click reliability testing including five JEDEC compliant sample tests Integrated support for a variety of LCR meters switch matrix confiqurations and both keithley series 3400 and agilent 81110 pulse generators Includes software drivers for leading analytical probers |
장비이미지코드 | http://nfec.ntis.go.kr/storage/images/equip/photo/201102/.thumb/20110207050139.jpg |
장비위치주소 | 서울시 관악구 신림동 산56-1 서울대학교 물리천문학부 22동 114호 복합나노소자 연구실 |
NFEC 등록번호 | NFEC-2011-02-139894 |
예약방법 | |
카타로그 URL | |
메뉴얼 URL | |
원문 URL | http://www.zeus.go.kr/equip/read?equipId=Z-NTIS-0025625 |
첨부파일 |
과학기술표준분류 | |
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ICT 기술분류 | |
주제어 (키워드) |