| 시설장비 설명 |
1. Particle size distribution analysis ranging from 0.017？m to 2000？m based on Laser Diffraction Method. 2. A variety of optical models available : Fraunhofer approximation, Mie theory and PIDS(Polarization Intensity Differential Scattering). 3. Flagship multi-wavelengths system (450, 600, 780, 900nm) allowing for a complete solution to the problem of sub-micron sizing. 4. 132 detector elements and 124 size classes for high resolution and sensitivity. 5. PIDS system for high accuracy in the sub-micron region by taking 42 individual detection measurements for this region alone. 6. X-shaped detector array allowing for the most accurate scattering patterns. 7. Automatic alignment using over 30 detector elements and dark field reticle for high reproducibility. 8. Multiple sample handling modules for dry powder, aqueous or solvents and minute sample volume are available for various applications. |
