주사탐침현미경
기관명 | ZEUS |
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장비번호 | |
제작사 | Bruker |
모델명 | Dimension Edge AFM |
장비사양 | |
취득일자 | 2010-09-17 |
취득금액 |
보유기관명 | 광주과학기술원 |
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보유기관코드 | |
활용범위 | |
활용상태 | |
표준코드 | A208 |
표준분류명 | |
시설장비 설명 | The Dimension Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovations of the Dimension Icon System to provide levels of performance and functionality only available from Bruker. Designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours you won’t find a more powerful mid-priced AFM anywhere else. Best Value Closed-Loop Dimension AFM Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels Reduced noise and drift bring small-sample imaging performance to large-sample AFM Microscope and electronics design enable high image fidelity at moderate cost Accurate High-Resolution Results Even Faster Linear workflow with visual feedback ensure optimized setup in shortest time Camera and stage provide best sample navigation and multi-site mea |
장비이미지코드 | http://www.zeus.go.kr/storage/images//equip/photo/201101/20110113202304.JPG |
장비위치주소 | 광주과학기술원 신재생에너지연구동 |
NFEC 등록번호 | NFEC-2011-01-133345 |
예약방법 | |
카타로그 URL | |
메뉴얼 URL | |
원문 URL | http://www.zeus.go.kr/resv/equip/read/Z-NTIS-0021796 |
첨부파일 |
과학기술표준분류 | |
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ICT 기술분류 | |
주제어 (키워드) |