| 시설장비 설명 |
특징 The JPK Instruments NanoWizard ?Atomic Force Microscope (AFM) bridges the worlds of optical microscopy and scanning probe microscopy by the press of a single button. The simultaneous availability of all optical microscopy features together with a high performance AFM gives the operator unrivaled flexibility and enables continuous mapping from the microscale to the nanoscale. 구성및성능 Proven stand-alone technology Hardware linearization in all 3 axis also for closed loop measurements Most stable platform for higest flexibility Integrates with advanced optical imaging (DIC, CLSM, TIRF, FRET ...) Works in native environment: real in-situ measurements Large scan range of 100μm x 100μm x 15μm Virtual instruments - control the system via the internet |
