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장비 및 시설 기본정보
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장비 개요
| 기관명 | ZEUS |
|---|---|
| 장비번호 | |
| 제작사 | HP |
| 모델명 | HP85170B |
| 장비사양 | |
| 취득일자 | 2000-02-08 |
| 취득금액 |
보유기관 및 이용정보
| 보유기관명 | 한국전자통신연구원 |
|---|---|
| 보유기관코드 | |
| 활용범위 | |
| 활용상태 | |
| 표준코드 | |
| 표준분류명 | |
| 시설장비 설명 | 특징 The Agilent 85107B microwave vector network analyzer is a complete systemm configured with an Agilent 8510C vector network analyzer a 50 GHz S-parameter test set a 50GHz synthesized sweeper and 2.4 mmmeasurement accessories Option 005 adds step attenuators and bias tees to the test set; option 007 provides high power and high dynamic range. The instruments are integrated in the system rack prior to shipment from the factory Installation is included at no additional charge. This preconfigured system is a complete solution for characterizing the linear behavior of either active or passive networks over the 45MHz to 50GHz frequency range.구성및성능 S-parameter measurements to 50GHz with high accuracy and speed. Measurements include but are not limiced to gain flatness VSWR group delay gain compression and power. Excellent performance at 50GHz With Option 007 the port power level is 16dBm with 75dB of dynamic range from 40 to 50GHz reducing the need for external amplification Superior performance of the 8517 test set delivers exceptional confidence in all your measurements The 85107 vector network analyzer (VNA) system is a complete system configured with a 50GHz syntjesized sweeper and a 50GHz S parameter test set in a system rack. This system delivers uncompromised per formance to 50GHz Outstanding performance The nasis for the 85107 VNAs excellent performance lies in the 8517 test set This test set has exceptional raw (uncorrected) test port characteristics.20.dB of directivity and 16dB of source match to 50GHz. These intrinsic characteristics of the test set proir to calibration substantially improve the overall calibration accuracy and stability that can be achieved. These capabilites help to ensure a more characterzation of amplifiers and active devices. High dynamic range With the 8517 test set 75dB of dynamic range is available at 50Ghz. High test port output power and sensitivity directly affect both the accuracy and speed of your measurements. High dynamic range coupled with oustanding raw directivity gives you confidence in measurements to 50Ghz. The permier measurement solution to 50Ghz The 85107 delivers unmatched RF performance to 50Ghz. Combining the 85107 with a wafer probing station allows on-wafer devices to be fully characterized over the frequency range of 45 Mhz to 50Ghz.The following specifiations describe the system perforance for the 8510C network analyzer in the 85107B Option 005 (adds steo attenuators and bias tees to the 8517B test set) configuration for 50Ghz measurements. T활용분야 Millimeter-wave components: wireless LAN waveguide measurements digital transmission equipment millimeter radar systems High power components: amplifiers for radio base stations SSPA LPA TWTA RF and microwave components: communication equipment statllite communication adbanced material research filter tuning/alignment Group delay measurements calibration of standards transmit/receive (T/R) module testing Lightwave components: lightwave measurements Antennas: satellite communication |
| 장비이미지코드 | http://nfec.ntis.go.kr/storage/images/equip/photo/201101/.thumb/20110118164347.jpg |
| 장비위치주소 | 대전광역시 유성구 가정로 138 10동 |
| NFEC 등록번호 | NFEC-2004-03-044377 |
| 예약방법 | |
| 카타로그 URL | |
| 메뉴얼 URL | |
| 원문 URL | http://www.zeus.go.kr/equip/read?equipId=Z-NTIS-0006899 |
| 첨부파일 |
추가정보
| 과학기술표준분류 | |
|---|---|
| ICT 기술분류 | |
| 주제어 (키워드) |