| 시설장비 설명 |
다음과 같은 측정이 가능합니다. Measurements: Spectroscopic acquisition with backside reflection correction User units selectable: eV, nm, cm-1 Step and Spectral range: user selectable Multiple angle of incidence acquisition Single or multi-wavelength kinetic acquisition Mapping of samples (automated stage) acquisition Modelling of optical and structural features Graphic display of curves and tables Library of materials dielectric functions Spectra manipulations: smoothing, derivatives, subtraction. Reflectance and Transmission. 12 elements of the Mueller-matrix |
