고속네트워크분석시스템
기관명 | ZEUS |
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장비번호 | |
제작사 | Agilent |
모델명 | 8517B |
장비사양 | |
취득일자 | 1999-12-30 |
취득금액 |
보유기관명 | 광주과학기술원 |
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보유기관코드 | |
활용범위 | |
활용상태 | |
표준코드 | |
표준분류명 | |
시설장비 설명 | The HP 8517B test set configured with an HP 8510B/C network analyzer and an HP 8360 series source creates a system capable of making S-parameter measurements from 45 MHz to 50 GHz. The system is particularly suited for making two-port device measurements. You can measure all four S-parameters without physically reversing the DUT (device under test). The system is also designed for making measurements on non-reciprocal devices or components like transistors amplifiers or isolators where S12 measurements are required. Checking System Operation Perform a system calibration as described in the HP 8510C Operating and Programming Manual. A successful calibration indicates that the system and therefore the test set are operating properly. Checking Specifications Specifications for the test set and the system can be determined by runningthe specification and performance verification software described in the HP 8510C On-Site Service Manual Chapter 8 “Specification and Performance Verification”. Additional mechanical specifications and supplemental characteristics are in Chapter 4 “Specifications” of this manual. Troubleshooting the Test Set To troubleshoot the test set refer to the HP 8510C On-Site Service Manual. Use the information in that manual to determine if the test set is at fault. If the test set is at fault refer to Chapter 5 “Troubleshooting the Test Set” in this manual to isolate the trouble. |
장비이미지코드 | http://nfec.ntis.go.kr/storage/images/equip/photo/201101/.thumb/20110118151028.JPG |
장비위치주소 | 광주 북구 오룡동 광주과학기술원 정보통신공학부 A동 3층 306호 광주과학기술원 정보통신공학부 A동 3층 306 |
NFEC 등록번호 | NFEC-2011-01-134350 |
예약방법 | |
카타로그 URL | |
메뉴얼 URL | |
원문 URL | http://www.zeus.go.kr/equip/read?equipId=Z-NTIS-0022302 |
첨부파일 |
과학기술표준분류 | |
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ICT 기술분류 | |
주제어 (키워드) |