| 보유기관명 |
한국생산기술연구원 |
| 보유기관코드 |
|
| 활용범위 |
|
| 활용상태 |
|
| 표준코드 |
B510 |
| 표준분류명 |
시험 |
| 시설장비 설명 |
1. FT-IR Microscope System 1) Interferometer : Dynamic Aligned Michelson Interferometer 2) Source : Ever-Glo Source user replaceable on external 3) Detector : DLaTGS w/KBr Detector (7800～450cm-1) MCT-A Detector(11700~600cm-1) 4) Beamsplitter : Ge-on-KBr Beamsplitter (7800 ～ 350cm-1) or better 5) Spectral range : 7800 ～ 450cm-1 or wider 6) Resolution : 0.4cm-1 7) Interferometer Alignment : Digital Dynamic Alignment 8) Rapid Scan : better than 40 scans/sec at 32cm-1 or better 9) Microscope Signal to Noise Ratio : 25000:1 between 2100 ～ 2000 cm-1 10) A/D converter : 24 bit high speed or better 11) Automatic Accessory recognition & parameter set-up : Enhanced Synchronization protocol or equivalent 12) Finity Corrected Optics for high performance View and IR 13) On-Axis Optics system for high throughput 14) LED illuminator for 3 position or better 15) Software for continuous View and Sample operation 16) Motorized Pre and Post Sample Masking with XY and Θ Control Dual Aperture 17) IR Mode |
| 장비이미지코드 |
http://www.zeus.go.kr/storage/images//equip/photo/201301/2013013117446122.jpg |
| 장비위치주소 |
한국생산기술연구원 금형기술센터 부천테크노파크 쌍용3차 301동 |
| NFEC 등록번호 |
NFEC-2013-02-175721 |
| 예약방법 |
|
| 카타로그 URL |
|
| 메뉴얼 URL |
|
| 원문 URL |
http://www.zeus.go.kr/resv/equip/read/Z-kitech-00351 |
| 첨부파일 |
|
