| 시설장비 설명 |
1. Non destructive and contactless measurement of any metallic coating/substrate 2. Measurements on extermely small fuctional areas irrespective of component shape 3. Measurement multiple coating such as Au/Ni/Cu/Fe 4. Simultaneous analysis and thickness measurement of binary alloy coating such as SnPb/Cu 5. Microprocess controlled and automatic measurement test objects are easily and reproducibly positioned on the X-Y-Z relevant to the particcular application,whether for indurstrial able by means of projected crosshairs and a video camera system |
