원자간력현미경
기관명 | ZEUS |
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장비번호 | |
제작사 | ㈜파크시스템스 |
모델명 | NX10 |
장비사양 | |
취득일자 | 2013-10-28 |
취득금액 |
보유기관명 | 한국생산기술연구원 |
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보유기관코드 | |
활용범위 | |
활용상태 | |
표준코드 | A208 |
표준분류명 | 기타 |
시설장비 설명 | Flexure guided XY scanner is used to maintain zero background curvature - Symmetric single module flexure 2D scanner structure - Out-of-plane motion: less than 1 nm over 40 μm scan range XY scan range: 50 μm × 50 μm (closed-loop) - 20 bit XY position control and 24 bit XY position sensor 2. Standard NX AFM Head Includes a high force Z scanner - Flexure guided structure driven by multiply stacked piezoelectric stacks - Z scan range: 15 μm - Primary resonant frequency: > 9 kHz Includes a probe hand to which a cantilever is attached - Mechanical oscillation frequency: Up to 3 MHz - Voltage bias range to the cantilever: -10 V to 10 V Detects the deflection of the cantilever using SLD (Super Luminescent Diode) fortopography feedback - SLD wavelength: 830 nm - SLD has low coherence length eliminating optical interference - SLD coherent length: ~50 μm Dovetail-lock head mount for easy mount/removal of the AFM head - Automatically connects to the electronics upon the mount Includes the IR detection kit to locate the |
장비이미지코드 | http://www.zeus.go.kr/storage/images//equip/photo/201405/2014051515287556.JPG |
장비위치주소 | 패키징기술센터 |
NFEC 등록번호 | NFEC-2014-05-188246 |
예약방법 | |
카타로그 URL | |
메뉴얼 URL | |
원문 URL | http://www.zeus.go.kr/resv/equip/read/Z-kitech-00245 |
첨부파일 |
과학기술표준분류 | |
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ICT 기술분류 | |
주제어 (키워드) |