주사전자현미경
기관명 | ZEUS |
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장비번호 | |
제작사 | Fei |
모델명 | Quanta 650 FEG |
장비사양 | |
취득일자 | 2011-12-08 |
취득금액 |
보유기관명 | 한국표준과학연구원 |
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보유기관코드 | |
활용범위 | |
활용상태 | |
표준코드 | A206 |
표준분류명 | |
시설장비 설명 | Addressing the need to investigate a wide variety of materials and characterize structure and composition the FEI QuantaTM FEG provides unmatched flexibility to increase both performance and versatility to handle the challenges of todays wide ranging research needs. View any sample and get all the data: surface images and compositional images can be combined with accessories for determining material properties and elemental composition. Todays research extends beyond simple metals and coated samples and the Quanta series can comfortably handle challenges to produce top quality images and analysis. The Quanta 50 series from FEI is the advanced flexible solution for current and future research applications. Featuring three imaging modes high vacuum low vacuum and ESEMTM it accommodates the widest range of samples of any SEM system. These instruments are engineered to provide maximum data imaging and microanalysis from all specimens with or without preparation. Characterization of both traditional samples from m |
장비이미지코드 | http://www.zeus.go.kr/storage/images//equip/photo/201111/20111129145522.JPG |
장비위치주소 | 한국표준과학연구원 신소재동 |
NFEC 등록번호 | NFEC-2011-11-151180 |
예약방법 | |
카타로그 URL | |
메뉴얼 URL | |
원문 URL | http://www.zeus.go.kr/resv/equip/read/Z-NTIS-0030489 |
첨부파일 |
과학기술표준분류 | |
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ICT 기술분류 | |
주제어 (키워드) |