프로브 스테이션
기관명 | ZEUS |
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장비번호 | |
제작사 | Lake Shore Cryotronics |
모델명 | CRX-4K |
장비사양 | |
취득일자 | 2013-10-29 |
취득금액 |
보유기관명 | 한국표준과학연구원 |
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보유기관코드 | |
활용범위 | |
활용상태 | |
표준코드 | C514 |
표준분류명 | 계측 |
시설장비 설명 | The Model CRX-4K is a versatile cryogen-free micro-manipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter. The CRX-4K is a platform for measurement of electrical electro-optical parametric high Z DC RF and microwave properties of materials and test devices. Nanoscale electronics quantum wires and dots and semiconductors are typical materials measured in a CRX-4K. A wide selection of probes cables sample holders and options makes it possible to configure the CRX-4K to meet your specific measurement applications. Based on a Sumitomo 4 K base temperature CCR the CRX-4K provides efficient temperature operation and control over a temperature range of 4.5 K to 350 K without the operating expense of liquid cryogens. An optional interchangeable high temperature sample stage provides a temperature range of 20 K to 500 K. Each cryogenic stage is equipped with a sensor and heater to provide fast thermal response and rapid warm up for sample exchang |
장비이미지코드 | http://www.zeus.go.kr/storage/images//equip/photo/201312/2013120995351213.jpg |
장비위치주소 | 한국표준과학연구원 계측기기동 |
NFEC 등록번호 | NFEC-2013-12-184273 |
예약방법 | |
카타로그 URL | |
메뉴얼 URL | |
원문 URL | http://www.zeus.go.kr/resv/equip/read/Z-NTIS-0041036 |
첨부파일 |
과학기술표준분류 | |
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ICT 기술분류 | |
주제어 (키워드) |